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Theoretical analysis of the microrelief of typical machine-made surfaces by SEM photogrammetry

custom.quartileScopus (Q4)
dc.contributor.authorBoyarska, Inna
dc.contributor.authorHomon, Sviatoslav
dc.contributor.authorKulakovskyi, Leonid
dc.contributor.authorKulakovskyi, Leonid
dc.date.accessioned2026-06-23T12:27:17Z
dc.date.issued2024
dc.description.abstractThe article analyzes digital elevation models (DEMs) of typical mechanically formed surfaces. The theoretical issues of 3D modeling of typical "ideal" surfaces obtained, for example, by artificially growing single crystals, forming regular microrelief of materials, etc. are considered. For this purpose, the most typical stepped, spherical, cylindrical, and cubic machined microrelief surfaces were selected. The algorithms for analytical photogrammetric and digital processing of SEM stereo images are presented and illustrated by relevant examples. The results of numerical integration for different surfaces are consistent with a typical "stepped" surface.
dc.identifier.citationUhl A., Melnyk O., Melnyk Y., Boyarska I., Homon S., Kulakovskyi L Theoretical analysis of the microrelief of typical machine-made surfaces by SEM photogrammetry. Procedia Structural Integrity. 2024. № 59. Р. 538-544.
dc.identifier.doi10.1016/j.prostr.2024.04.076
dc.identifier.issn2452-3216
dc.identifier.urihttps://repository.lntu.edu.ua/handle/123456789/4937
dc.language.isoen
dc.relation.ispartofProcedia Structural Integrity
dc.subjectmicrorelief
dc.subjectphotogrammetry
dc.subjectsurface
dc.subjectlectron microscope
dc.subjectsingle crystals
dc.titleTheoretical analysis of the microrelief of typical machine-made surfaces by SEM photogrammetry
dc.title.alternativeТеоретичний аналіз мікрорельєфу типових машинно-виготовлених поверхонь за допомогою SEM-фотограмметрії
dc.typeArticle
dspace.entity.typeScientificArticle
oaire.citation.volume59

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